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CT4560

Name: Cal Test Electronics CT4560
Brand: Cal Test
SKU: 510-CT4560
Price: 437925 IDR
Availability: InStock

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See Product Specifications

Mouser No:

510-CT4560

Mfr. No:

CT4560

Mfr.:

Cal Test

Description:

Test Probes Probe 5mm, 1x, 55MHz, Champagne

Lifecycle:

New Product:

New from this manufacturer.

Datasheet:

CT4560 Datasheet (PDF)

More Information

Learn more about Cal Test CT4560

In Stock: 4

Stock:: 4 Can Dispatch Immediately

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Factory Lead Time:: 12 Weeks Estimated factory production time for quantities greater than shown.

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Pricing (IDR)

Qty.	Unit Price	Ext. Price
	Rp437.925	Rp437.925

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Product Attribute	Attribute Value	Select Attribute
Manufacturer:	Cal Test Electronics
Product Category:	Test Probes
RoHS:
Equipment Type:	Oscilloscope Probe
Bandwidth:	55 MHz
Voltage Rating:	55 VAC
Brand:	Cal Test
Country of Assembly:	TW
Country of Diffusion:	Not Available
Country of Origin:	TW
Packaging:	Bulk
Product:	Test Probe
Product Type:	Test Probes
Series:	CT4560
Factory Pack Quantity:	1
Subcategory:	Test Leads, Banana Plugs, Alligator Clips & Test Probes

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Datasheet

CT4560 Datasheet (PDF)

USHTS:: 9030908911
ECCN:: EAR99

CT4560 Oscilloscope Probes

Cal Test Electronics CT4560 Oscilloscope Probes are engineered for a broad range of electrical testing scenarios and deliver dependable performance. These oscilloscope probes feature attenuation ranges from X1 to X100 and bandwidths from 55MHz to 500MHz. The CT4560 oscilloscope probes are constructed with high-quality materials to ensure durability, precision, and long-term reliability. These oscilloscope probes support a wide range of signal amplitudes and are suitable for low-frequency analog signals to high-speed digital waveforms. The select models of CT4560 oscilloscope probes support voltage measurements of either 2kV_rms or 4kV_rms, with one 4kV_rms model offering 1% measurement accuracy for precision-critical applications. Applications include general-purpose signal monitoring, troubleshooting and diagnostics in electronic circuits, design validation and verification, and educational lab environments.